先进原子力显微方法

"Advanced Atomic Force MicroscopyTechniques" focuses on exploring the multifunctionality and variousmeasurement modes of Atomic Force Microscopy (AFM), as well as theirapplications in materials science. Through this course, students will gain acomprehensive understanding of the operational principles of AFM, itsmulti-mode capabilities, and data analysis methods, enabling them to performprecise analysis of the surface and interfacial properties of materials at thenanoscale. The course covers the fundamental knowledge of AFM, operationaltechniques, and features and applications of various measurement modes such ascontact mode, non-contact mode, Scanning Kelvin Probe Microscopy (SKPM),Magnetic Force Microscopy (MFM), and Piezoresponse Force Microscopy (PFM).These modes allow students not only to observe the morphology of samplesurfaces but also to measure a variety of physical properties, includingmechanical, magnetic, and electrical characteristics. Through theoreticalexplanations and case studies, students will deeply understand thecomprehensive application of AFM technology and master how to solve practicalscientific problems using different modes.